English  |  正體中文  |  简体中文  |  Items with full text/Total items : 49287/83828 (59%)
Visitors : 7150951      Online Users : 65
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/76932


    Title: 低捕捉功率快速掃描測試架構之研究
    Other Titles: The Research of Low Capture Power (Lcp) At-Speed Scan Architecture
    Authors: 饒建奇
    Contributors: 淡江大學電機工程學系
    Keywords: 測試;低功率;全掃描;Testing;Low-Power;Full-Scan
    Date: 2011-08
    Issue Date: 2012-05-22 22:14:13 (UTC+8)
    Appears in Collections:[電機工程學系暨研究所] 研究報告

    Files in This Item:

    There are no files associated with this item.

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback