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    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/76415

    Title: A Study of Image Reconstruction for Complex Targets Buried in a Slab Medium Using the Unrelated Illumination Method
    Authors: Chiu, Chien-ching;Li, Ching-lieh;Wu, Chih-yuan;Lin, Chun-jen
    Contributors: 淡江大學電機工程學系
    Keywords: Complex targets;Cross section;Dielectric cylinder;Dielectric medium;E-field;Ill-posedness;Incident fields;Incident waves;Inhomogeneous dielectrics;Inverse scattering;Matrix operations;Measured data;Non-Linearity;Nonlinear integral equations;Numerical results;Permittivity distributions;Scattered field;Slab medium;Unrelated illumination method;Cylinders (shapes);Dielectric devices;Electric properties;Gaussian noise (electronic);Image reconstruction;Integral equations;Method of moments;Nonlinear equations;Scattering;Dielectric materials
    Date: 2012-01-01
    Issue Date: 2013-03-12 11:25:38 (UTC+8)
    Publisher: Conshohocken: ASTM International
    Abstract: This paper investigates the image reconstruction for inhomogeneous dielectric cylinders coated on a conductor with a known cross section buried in a stratified dielectric medium. The buried dielectric cylinder scatters a group of unrelated incident waves illuminated from outside. The scattered field is recorded outside the stratified dielectric medium. By the proper arrangement of a group of unrelated incident fields, the difficulties of ill-posedness and nonlinearity are circumvented, and the permittivity distribution can be reconstructed through simple matrix operations. In the direct scattering part, a set of nonlinear integral equations is deduced mainly based on the boundary conditions. The method of moments is applied to numerically calculate the scattered E field. For the inverse scattering part, the unrelated illumination method is employed to determine the electrical properties of the dielectric cylinder from the measured scattered E fields. The numerical results show that good reconstruction can be obtained both with and without Gaussian noise in measured data.
    Relation: Journal of Testing and Evaluation 40(1), JTE103788 (7pages)
    DOI: 10.1520/JTE103788
    Appears in Collections:[Graduate Institute & Department of Electrical Engineering] Journal Article

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