English  |  正體中文  |  简体中文  |  Items with full text/Total items : 49287/83828 (59%)
Visitors : 7154205      Online Users : 87
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/76316


    Title: 具有累積損害過程之加速退化檢定之研究
    Other Titles: A Research on Accelerated Degradation Test with a Cumulative Damage Process(II)
    Authors: 蔡宗儒
    Contributors: 淡江大學統計學系
    Keywords: Arrhenius law 模型;漂移參數;exponential law 模型;power law模型;逐步應力模型Arrhenius law model;draft parameter;exponential law model;power law model;step-stress loading method
    Date: 2011
    Issue Date: 2012-05-07 13:42:28 (UTC+8)
    Abstract: Following my project in August 1, 2010 to July 31, 2011, this research investigates the statistical inference of lifetimes of high-reliability products under the accelerated degradation test model. Considering the physical conditions and requirements in practical test situations for high-reliability products, this research will develop an inference procedure with three phases for accelerated degradation data based on the stochastic process methods. In Phase I, a training program was conducted for personnel. We set up experimental conditions for the constant-stress accelerated degradation test and collaborated with the Electronics and Opto-Electronics Research Laboratories, Industrial Technology Research Institute in Taiwan for collecting degradation information of high power light emitting diode lamps. The statistical model and inference methods will be developed, too. The Phase I project was granted by the National Science Council, Taiwan from August 1, 2010 to July 31, 2011. Till November 30, 2011, we implemented the accelerated degradation test over 3000 hours for light emitting diode lamps with six combinations of stress levels of ambient temperature and current. In Phase II, we will evaluate the quality of gathered degradation information of light emitting diode lamps and make a decision to develop an extra accelerated degradation test or not. Then start to conduct an intensive simulation study to evaluate the performance of the proposed method. Moreover, the proposed method will be illustrated by the degradation data of light emitting diode lamps. In Phase III, the performance of the estimated mean life and percentiles of the lifetimes of light emitting diode lamps using the proposed method will be compared with those using different existing methods in the literature. Moreover, a study will be conducted to determine the optimal design conditions including the sample size, the measurement frequency and the stopping time of test.
    Following my project in August 1, 2010 to July 31, 2011, this research investigates the statistical inference of lifetimes of high-reliability products under the accelerated degradation test model. Considering the physical conditions and requirements in practical test situations for high-reliability products, this research will develop an inference procedure with three phases for accelerated degradation data based on the stochastic process methods. In Phase I, a training program was conducted for personnel. We set up experimental conditions for the constant-stress accelerated degradation test and collaborated with the Electronics and Opto-Electronics Research Laboratories, Industrial Technology Research Institute in Taiwan for collecting degradation information of high power light emitting diode lamps. The statistical model and inference methods will be developed, too. The Phase I project was granted by the National Science Council, Taiwan from August 1, 2010 to July 31, 2011. Till November 30, 2011, we implemented the accelerated degradation test over 3000 hours for light emitting diode lamps with six combinations of stress levels of ambient temperature and current. In Phase II, we will evaluate the quality of gathered degradation information of light emitting diode lamps and make a decision to develop an extra accelerated degradation test or not. Then start to conduct an intensive simulation study to evaluate the performance of the proposed method. Moreover, the proposed method will be illustrated by the degradation data of light emitting diode lamps. In Phase III, the performance of the estimated mean life and percentiles of the lifetimes of light emitting diode lamps using the proposed method will be compared with those using different existing methods in the literature. Moreover, a study will be conducted to determine the optimal design conditions including the sample size, the measurement frequency and the stopping time of test.
    Appears in Collections:[統計學系暨研究所] 研究報告

    Files in This Item:

    There are no files associated with this item.

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback