具有累積損害過程之加速退化檢定之研究(I)

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Title:	具有累積損害過程之加速退化檢定之研究(I)
Other Titles:	A Research on Accelerated Degradation Test with a Cumulative Damage Process(I)
Authors:	蔡宗儒
Contributors:	淡江大學統計學系
Keywords:	加速退化檢定;固定應力;壽命分配;隨機過程;逐步應力設計;Accelerated degradation test;constant stress;life distribution;stochastic process;step-stress design
Date:	2010
Issue Date:	2012-05-07 13:42:21 (UTC+8)
Abstract:	本計畫將對高可靠度產品在加速退化檢定模型實驗下推論產品之壽命。為讓所發展的方法符合高可靠度產品之物理特性及實際需求, 本研究捨棄逐步應力方法, 致力於研究固定應力逐步退化檢定設計與隨機過程方法在高可靠度產品壽命檢定上的應用。整個計畫將分三個階段進行。第一個階段將進行計畫人員訓練、加速退化之實驗設計配置、洽詢實驗室進行高功率LED 燈泡退化資料之收集, 並同步進行統計模型之推導與架設。第二個階段將擬訂模擬程序、對所建立的統計分析模型及分析方法進行緊密的統計模擬驗證模型效能, 並將前述模型應用在實際收集到的高功率LED 資料上。第三個階段將比較所收集的資料在不同統計模型下所估計結果之差異, 並對所提出的方法進行最佳參數設計之研究, 以決定最適樣本數、收集退化資料之檢查頻率及最佳實驗停止時間。 This research investigates the statistical inference of lifetimes of high-reliability products under the accelerated degradation test model. Consider the physical conditions of high- reliability products and the experimental requirements in practical situations, this research will conduct a statistical inference procedure based on the stochastic process method under the accelerated degradation test with a constant stress design. We plan to implement this research with three phases. In Phase I, a training program will be conducted for personnel in this project, set up an experimental design for the accelerated degradation test, contact a local laboratory for collecting degradation information of high power light emmitting diodes (LED) lamps and construct the statistical model and find the methods of statistical inference. In Phase II, we will conduct an intensive simulation study to evaluate the performance of the proposed method. Moreover, the proposed method will be illustrated by degradation data of LED lamps. In the last phase, we will evaluate the mean life and the percentiles of the lifetimes of LED lamps under different proposed methods in the literature with the proposed method. Moreover, a study will be conducted to determine the optimal parameters of the sample sizes, the inspected and measurement frequencies and the stopping time of life-testing.
Appears in Collections:	[Graduate Institute & Department of Statistics] Research Paper

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