使用選擇性X遮罩編碼去減少測試控制資料量的方法

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Title:	使用選擇性X遮罩編碼去減少測試控制資料量的方法
Other Titles:	A new method of a new method of reducing testing control data using the selective of X-masking coding
Authors:	黃敬棠;Huang, Jing-Tang
Contributors:	淡江大學電機工程學系碩士班饒建奇
Keywords:	X遮罩;X-masking
Date:	2011
Issue Date:	2011-12-28 19:24:23 (UTC+8)
Abstract:	在傳統的測試方法上，從待測電路(CUT)壓縮測試輸出信號有兩種方法。其中一種方法多輸入簽名暫存器（MISR），已被使用了幾十年。但這個方法是不能有任何的X值進入MSIR。因此，在輸出端需要一個遮罩(mask)去處理X的值。傳統的X遮罩技術，需要很多的資料量加以控制，這些資料量占據了絕大部分的記憶體空間。而本文提出了一種選擇性的X遮罩的編碼，進一步減少了控制碼的資料量。在實驗結果中，掃描鏈反應(scan response)產生了更好的壓縮比(compression ratio)，對於在較長而且X連續性較多的電路裡，減少控制碼的量越明顯，除此之外，此方法所使用的解壓縮硬體可以被運用在任何學術或業界電路中。 Traditionally, the circuit under test (CUT) compression test output signal in two ways. One way, multiple input signature register (MISR) has been used for decades. However, this method can not have any X value into the MSIR. Therefore, the output needs a mask to deal with the X value. Traditional X-mask technology needs a large number of data to control. This paper presents a selective encoding of X mask to further reduce the amount of data of control codes. In the experimental results, the scan response produced a number of better compression ratio (CR), For contain longer and more continuous X circuit, the amount of control code which are reduced more obvious, in addition, the extract hardware can be used in any academic or industry circuits.
Appears in Collections:	[Graduate Institute & Department of Electrical Engineering] Thesis

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