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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/74700

    Title: 可調式電壓比較電路及可調式電壓檢測裝置
    Other Titles: Adjustable voltage comparing circuit and adjustable voltage examining module
    Authors: 吳永裕;Wu, Yung-Yu
    Contributors: 淡江大學電機工程學系碩士在職專班
    李揚漢;Lee, Yang-Han
    Keywords: 數位類比轉換器;比較;記憶;可調式;檢測;DAC;Comparing;Memory;Adjustable;Examining
    Date: 2011
    Issue Date: 2011-12-28 19:21:42 (UTC+8)
    Abstract: 在這篇論文裡,我們提出一種可實施於數位測試機上的可調式電壓檢測裝置,這種檢測裝置可用來測量Analog Attenuator ICs的多個類比電壓輸出,特別可用於同步量測多個通道及多階類比電壓輸出,能實現更有效率的測試、快速的檢測出錯誤及降低生產成本。
    In this paper, We present an adjustable voltage examining module that can be used to digital automatic test equipment (ATE). This examining module can be used to measure the analog voltage outputs of analog attenuator ICs. This can be measured synchronous for multi-channels and multi-steps analog output. It is implemented the high test effectively, fastest the defects found out and lower production cost.
    This base structure of examining module implements the ADC measurement function using the DAC and the comparators. Advantage feature is extending easier to multi-channels with measure synchronous. This examining module includes the memory on itself. We can create the necessary voltage value array. This voltage value array can be written to memory. It is implemented the adjustable voltage comparing test.
    Simulation and experimental results can be proved adjustable voltage comparing (AVC) circuit that has short test time. Each measurement time is taken 20 micro seconds. This test time is three-thousandth of traditional PMU test. This adjustable voltage comparing circuit can be provided one more fast test method and easy to be applied.
    Appears in Collections:[電機工程學系暨研究所] 學位論文

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