淡江大學機構典藏:Item 987654321/74354
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    题名: 具累積損害過程之恆定應力加速退化測試
    其它题名: Constant-stress accelerated degradation tests under cumulative damage process
    作者: 宋依玲;Sung, Yi-Ling
    贡献者: 淡江大學統計學系碩士班
    蔡宗儒;Tsai, Tzong-Ru
    关键词: 加速退化檢定;累積損害過程;逆高斯分配;Wiener 隨機過程;Accelerated degradation test;Cumulative damage process;Inverse Gaussian distribution;Wiener process
    日期: 2011
    上传时间: 2011-12-28 18:24:32 (UTC+8)
    摘要: 為了在有限的時間內推估高功率LED 晶粒的可靠度, 本論文使用雙應力變數對高功率LED 晶粒進行恆定應力加速退化測試實驗。假設加速退化實驗所收集的元件之累積損害退化資料服從Wiener 隨機過程, 我們建議以逆高斯分配建立了加速退化模型, 進而推導出產品壽命百分位數的點估計值及信賴下界。本文並以高功率LED 晶粒退化資料實例來說明本方法之應用。
    It is difficult to evaluate the lifetimes of high reliable products in limited experimental time. In this thesis, statistical methods based on a two-variable constant-stress loading accelerated degradation test are developed to overcome this difficulty. Assuming the cumulative damage information of test units due to degradation has a Wiener process, the inverse Gaussian distribution is used to derive the lifetime percentiles and their low confidence bounds. A real example of LED chips data set is used to demonstrate the application of the proposed method.
    显示于类别:[統計學系暨研究所] 學位論文

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