具累積損害過程之恆定應力加速退化測試

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Title:	具累積損害過程之恆定應力加速退化測試
Other Titles:	Constant-stress accelerated degradation tests under cumulative damage process
Authors:	宋依玲;Sung, Yi-Ling
Contributors:	淡江大學統計學系碩士班蔡宗儒;Tsai, Tzong-Ru
Keywords:	加速退化檢定;累積損害過程;逆高斯分配;Wiener 隨機過程;Accelerated degradation test;Cumulative damage process;Inverse Gaussian distribution;Wiener process
Date:	2011
Issue Date:	2011-12-28 18:24:32 (UTC+8)
Abstract:	為了在有限的時間內推估高功率LED 晶粒的可靠度, 本論文使用雙應力變數對高功率LED 晶粒進行恆定應力加速退化測試實驗。假設加速退化實驗所收集的元件之累積損害退化資料服從Wiener 隨機過程, 我們建議以逆高斯分配建立了加速退化模型, 進而推導出產品壽命百分位數的點估計值及信賴下界。本文並以高功率LED 晶粒退化資料實例來說明本方法之應用。 It is difficult to evaluate the lifetimes of high reliable products in limited experimental time. In this thesis, statistical methods based on a two-variable constant-stress loading accelerated degradation test are developed to overcome this difficulty. Assuming the cumulative damage information of test units due to degradation has a Wiener process, the inverse Gaussian distribution is used to derive the lifetime percentiles and their low confidence bounds. A real example of LED chips data set is used to demonstrate the application of the proposed method.
Appears in Collections:	[Graduate Institute & Department of Statistics] Thesis

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