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    Title: Determination of the microstructure of Eu-treated ZnO nanowires by x-ray absorption
    Authors: Huang, W. L.;Labis, J.;Ray, S. C.;Liang, Y. R.;Pao, C. W.;Tsai, H. M.;Du, C. H.;Pong, W. F.;Chiou, J. W.;Tsai, M.-H.;Lin, H. J.;Lee, J. F.;Chou, Y. T.;Shen, J. L.;Chen, C. W.;Chi, G. C.
    Contributors: 淡江大學物理學系
    Keywords: Ozone;Zinc;Zinc;Extended X-ray absorption fine structure spectroscopy;II-VI semiconductors
    Date: 2010-02
    Issue Date: 2011-10-24 11:05:03 (UTC+8)
    Publisher: College Park: American Institute of Physics
    Abstract: X-ray absorption near-edge structure (XANES), extended x-ray absorption fine structures (EXAFS), and photoluminescence measurements were used to elucidate the microstructural and photoluminescence properties of ZnO nanowires (ZnO-NWs) that had been treated with Eu by thermal diffusion. The O K- and Eu L3-edge XANES and EXAFS spectra at the Zn K- and Eu L3-edge verified the formation of Eu2O3-like layer on the surface of ZnO-NWs. X-ray diffraction, XANES and EXAFS measurements consistently suggest the lack of substitutional doping of Eu ions at the Zn ion sites in the interior of ZnO-NWs. The clear sharp and intense emission bands in the range 610–630 nm of Eu-treated ZnO-NWs originated from the intra-4f transition of Eu ions in the Eu2O3-like surface layer.
    Relation: Applied Physics Letters 96(6), 062112(3pages)
    DOI: 10.1063/1.3304071
    Appears in Collections:[物理學系暨研究所] 期刊論文

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