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    Title: Local atomic and electronic structures and ferroelectric properties of PbZr0.52Ti0.48O3: An x-ray absorption study
    Authors: Ray, S. C.;Hsueh, H. C.;Wu, C. H.;Pao, C. W.;Asokan, K.;Liu, M. T.;Tsai, H. M.;Chuang, C. H.;Pong, W. F.;Chiou, J. W.;Tsai, M. H.;Lee, J. M.;Jang, L. Y.;Chen, J. M.;Lee, J. F.
    Contributors: 淡江大學物理學系
    Date: 2011-07-29
    Issue Date: 2011-10-24 10:44:54 (UTC+8)
    Publisher: College Park: American Institute of Physics
    Abstract: This work investigates local atomic and electronic structures of PbZr0.52Ti0.48O3 (PZT) thin films with <001>, <101>, and <111> orientations using extended x-ray absorption fine structure (EXAFS) and x-ray absorption near-edge structure (XANES) spectroscopy with θ = 0° and 70° incident angles. The EXAFS result indicates that the <001>-oriented PZT film has a polarization dominantly along the c-axis, while both <101>- and <111>-oriented PZT films have a dominant in-ab-plane polarization. The hysteresis-loop measurements show that the <001>-oriented PZT film has a much larger coercive field than those of other two PZT films, which indicates that the double-well potential along the c-axis is much deeper than that in the ab-plane.
    Relation: Applied Physics Letters 99(4), 042909(3pages)
    DOI: 10.1063/1.3607475
    Appears in Collections:[Graduate Institute & Department of Physics] Journal Article

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