Electronic structure of the carbon nanotube tips studied by x-ray-absorption spectroscopy and scanning photoelectron microscopy

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题名:	Electronic structure of the carbon nanotube tips studied by x-ray-absorption spectroscopy and scanning photoelectron microscopy
作者:	Chiou, J. W.;Yueh, C. L.;Jan, J. C.;Tsai, H. M.;Pong, W. F.;Hong, I.-H.;Klauser, R.;Tsai, M.-H.;Chang, Y. K.;Chen, Y. Y.;Wu, C. T.;Chen, K. H.;Wei, S. L.;Wen, C. Y.;Chen, L. C.;Chuang, T. J.
贡献者:	淡江大學物理學系
关键词:	carbon nanotubes;XANES;electronic structure;photoelectron spectroscopy;microscopy
日期:	2002-11
上传时间:	2013-05-31 11:32:21 (UTC+8)
出版者:	College Park: American Institute of Physics
摘要:	Angle-dependent x-ray absorption near edge structure (XANES) and scanning photoelectron microscopy (SPEM) measurements have been performed to differentiate local electronic structures of the tips and sidewalls of highly aligned carbon nanotubes. The intensities of both π∗- and σ∗-band C K-edge XANES features are found to be significantly enhanced at the tip. SPEM results also show that the tips have a larger density of states and a higher C 1s binding energy than those of sidewalls. The increase of the tip XANES and SPEM intensities are quite uniform over an energy range wider than 10 eV in contrast to earlier finding that the enhancement is only near the Fermi level.
關聯:	Applied Physics Letters 81(22), pp.4189-4191
DOI:	10.1063/1.1523152
显示于类别:	[物理學系暨研究所] 期刊論文

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