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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/72624

    Title: Electronic structure of the carbon nanotube tips studied by x-ray-absorption spectroscopy and scanning photoelectron microscopy
    Authors: Chiou, J. W.;Yueh, C. L.;Jan, J. C.;Tsai, H. M.;Pong, W. F.;Hong, I.-H.;Klauser, R.;Tsai, M.-H.;Chang, Y. K.;Chen, Y. Y.;Wu, C. T.;Chen, K. H.;Wei, S. L.;Wen, C. Y.;Chen, L. C.;Chuang, T. J.
    Contributors: 淡江大學物理學系
    Keywords: carbon nanotubes;XANES;electronic structure;photoelectron spectroscopy;microscopy
    Date: 2002-11
    Issue Date: 2013-05-31 11:32:21 (UTC+8)
    Publisher: College Park: American Institute of Physics
    Abstract: Angle-dependent x-ray absorption near edge structure (XANES) and scanning photoelectron microscopy (SPEM) measurements have been performed to differentiate local electronic structures of the tips and sidewalls of highly aligned carbon nanotubes. The intensities of both π∗- and σ∗-band C K-edge XANES features are found to be significantly enhanced at the tip. SPEM results also show that the tips have a larger density of states and a higher C 1s binding energy than those of sidewalls. The increase of the tip XANES and SPEM intensities are quite uniform over an energy range wider than 10 eV in contrast to earlier finding that the enhancement is only near the Fermi level.
    Relation: Applied Physics Letters 81(22), pp.4189-4191
    DOI: 10.1063/1.1523152
    Appears in Collections:[Graduate Institute & Department of Physics] Journal Article

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