English  |  正體中文  |  简体中文  |  Items with full text/Total items : 50124/85142 (59%)
Visitors : 7912027      Online Users : 69
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/72624


    Title: Electronic structure of the carbon nanotube tips studied by x-ray-absorption spectroscopy and scanning photoelectron microscopy
    Authors: Chiou, J. W.;Yueh, C. L.;Jan, J. C.;Tsai, H. M.;Pong, W. F.;Hong, I.-H.;Klauser, R.;Tsai, M.-H.;Chang, Y. K.;Chen, Y. Y.;Wu, C. T.;Chen, K. H.;Wei, S. L.;Wen, C. Y.;Chen, L. C.;Chuang, T. J.
    Contributors: 淡江大學物理學系
    Keywords: carbon nanotubes;XANES;electronic structure;photoelectron spectroscopy;microscopy
    Date: 2002-11
    Issue Date: 2013-05-31 11:32:21 (UTC+8)
    Publisher: College Park: American Institute of Physics
    Abstract: Angle-dependent x-ray absorption near edge structure (XANES) and scanning photoelectron microscopy (SPEM) measurements have been performed to differentiate local electronic structures of the tips and sidewalls of highly aligned carbon nanotubes. The intensities of both π∗- and σ∗-band C K-edge XANES features are found to be significantly enhanced at the tip. SPEM results also show that the tips have a larger density of states and a higher C 1s binding energy than those of sidewalls. The increase of the tip XANES and SPEM intensities are quite uniform over an energy range wider than 10 eV in contrast to earlier finding that the enhancement is only near the Fermi level.
    Relation: Applied Physics Letters 81(22), pp.4189-4191
    DOI: 10.1063/1.1523152
    Appears in Collections:[物理學系暨研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat
    1.1523152.pdf556KbAdobe PDF168View/Open
    index.html0KbHTML183View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback