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    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/72612


    Title: Electronic properties of a-CNx thin films: An x-ray-absorption and photoemission spectroscopy study
    Authors: Ray, S.C.;Pao, C.W.;Chiou, J.W.;Tsai, H. M.;Jan, J. C.;Pong, W. F.;McCann, R.;Roy, S. S.;Papakonstantinou, P.;McLaughlin, J. A.
    Contributors: 淡江大學物理學系
    Date: 2005-08
    Issue Date: 2011-10-24 10:41:04 (UTC+8)
    Publisher: College Park: American Institute of Physics
    Abstract: The electronic properties of amorphous carbon nitride were studied by x-ray-absorption near-edge structure (XANES) and valence-band photoelectron spectroscopy (PES). The nitrogen incorporation was found to induce graphitization, as evidenced by an increase of the sp2 cluster in C and N K-edge XANES spectra. The structure is found to be similar to pyridine. Hybridized C–N bond lengths were determined from the position of the σ* resonance of XANES spectra and the obtained results suggest sp2 hybridization. A valence-band PES spectrum showed that the p‐π band became more intense than the p‐σ band upon higher at. % nitrogen addition, which confirmed the role played by the π bonds in controlling the electronic structure of a‐CNx films.
    Relation: Journal of Applied Physics 98(3), 033708(4pages)
    DOI: 10.1063/1.1994933
    Appears in Collections:[物理學系暨研究所] 期刊論文

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