淡江大學機構典藏:Item 987654321/72556
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    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/72556


    Title: Some optimal designs for grouped data in reliability demonstration tests
    Authors: Wei, Duan;Bau, Jinn-jomp
    Contributors: 淡江大學財務金融學系
    Keywords: Estimation;Grouped data;Log-logistic distribution;Log-normal distribution;Logistic distribution;Normal/Gaussian distribution;Reliability demonstration;Reliability measurement;Testing
    Date: 1987-12
    Issue Date: 2011-10-24 10:33:24 (UTC+8)
    Publisher: IEEE Reliability Society
    Abstract: The paper considers optimal demonstration testdesigns with grouped inspection data from logistic, log-logistic, normal/Gaussian and log-normal distributions, along with the test statistics of the mean life and reliability for distributions.
    Relation: IEEE Transactions on Reliability R36(5), pp.600-604
    DOI: 10.1109/TR.1987.5222481
    Appears in Collections:[Graduate Institute & Department of Banking and Finance] Journal Article

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