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    题名: Goodness-of-Fit Test-Statistics on Gaussian and Exponential Reliability Data
    作者: Wei, Duan;Chen, C.Y.
    贡献者: 淡江大學財務金融學系
    关键词: Power comparison;Goodness-of-fit test statistic;Gaussian distribution;Exponential distribution
    日期: 1912-01-01
    上传时间: 2011-10-24 10:31:29 (UTC+8)
    摘要: The paper presents three statisics for testing s-normality and one statistic for testing exponentiality in system reliability data. The distributions of these statistics were approximated by using Monte Carlo simulation. The power of these statistics is investigated with respect to several alternatives. For testing small sample s- normality, two of them, namely, the newly proposed Lilliefors type statistic and sample skewness coefficient have very good power.
    關聯: IEEE Tran. reliability R32(5), pp.492-495
    DOI: 10.1109/TR.1983.5221740
    显示于类别:[財務金融學系暨研究所] 期刊論文

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