The AB-Filling Methodology for Power-aware At-Speed Scan Testing

淡江大學機構典藏 > 工學院 > 電機工程學系暨研究所 > 會議論文 > Item 987654321/70572

jsp.display-item.identifier=請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/70572

题名:	The AB-Filling Methodology for Power-aware At-Speed Scan Testing
作者:	Chen, Tsung-tang;Wu, Po-han;Chen, Kung-han;Rau, Jiann-chyi;Tzeng, Shih-ming
贡献者:	淡江大學電機工程學系
日期:	2010-10-31
上传时间:	2011-10-23 21:27:15 (UTC+8)
出版者:	IEEE Computer Society Test Technology Thchnical Council; IEEE Philadelpjia Section
摘要:	ATPG-based technique for reducing shift and capture power during scan testing is presented without any influence on fault coverage. This paper presents Adjacent Backtracing filling (AB-fillingl) which both adjacent and backtracing filling algorithms are used, is integrated in the ATPG algorithm to reduce capture power while feeding the first test pattern into CUT. After our approach for at-speed scan testing, all of test patterns have assigned as partially-specified values with a small number of don't care value (x) bits as in test compression, and it is a low capture power and considering the shift power test pattern. Experimental results for ISCAS'89 benchmark circuits show that the proposed scheme outperforms previous method in capture power.
關聯:	Proceedings of 2010 IEEE International Test Conference (ITC), poster #7(1 pages)
DOI:	10.1109/TEST.2010.5699299
显示于类别:	[電機工程學系暨研究所] 會議論文

文件中的档案:

档案	描述	大小	格式	浏览次数
The AB-Filling Methodology for Power-Aware At-Speed Scan Testing.pdf	全文檔	465Kb	Adobe PDF	214	检视/开启

在機構典藏中所有的数据项都受到原著作权保护.

TAIR相关文章