Reducing Switching Activity by Test Slice Difference Technique for Test Volume Compression

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題名:	Reducing Switching Activity by Test Slice Difference Technique for Test Volume Compression
作者:	Li, Wei-Lin;Wu, Po-Han;Rau, Jiann-Chyi
貢獻者:	淡江大學電機工程學系
日期:	2009-05-24
上傳時間:	2011-10-23 21:24:48 (UTC+8)
出版者:	IEEE Circuits and Systems Society; National Cheng Kung University
摘要:	This paper presents a test slice difference (TSD) technique to improve test data compression. It is an efficient method and only needs one scan cell. Consequently, hardware overhead is much lower than cyclical scan chains (CSR). As the complexity of VLSI continues to grow, excessive power supply noise has become seriously. We propose a new compression scheme which smooth down the switching activity and reduce the test data volume simultaneously.
關聯:	Proc. of IEEE International Symposium on Circuits and Systems (ISCAS), pp.2986-2989
DOI:	10.1109/ISCAS.2009.5118430
顯示於類別:	[電機工程學系暨研究所] 會議論文

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