English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 58323/91876 (63%)
造访人次 : 14055653      在线人数 : 67
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/70543


    题名: Reducing Switching Activity by Test Slice Difference Technique for Test Volume Compression
    作者: Li, Wei-Lin;Wu, Po-Han;Rau, Jiann-Chyi
    贡献者: 淡江大學電機工程學系
    日期: 2009-05-24
    上传时间: 2011-10-23 21:24:48 (UTC+8)
    出版者: IEEE Circuits and Systems Society; National Cheng Kung University
    摘要: This paper presents a test slice difference (TSD) technique to improve test data compression. It is an efficient method and only needs one scan cell. Consequently, hardware overhead is much lower than cyclical scan chains (CSR). As the complexity of VLSI continues to grow, excessive power supply noise has become seriously. We propose a new compression scheme which smooth down the switching activity and reduce the test data volume simultaneously.
    關聯: Proc. of IEEE International Symposium on Circuits and Systems (ISCAS), pp.2986-2989
    DOI: 10.1109/ISCAS.2009.5118430
    显示于类别:[電機工程學系暨研究所] 會議論文

    文件中的档案:

    档案 描述 大小格式浏览次数
    index.html0KbHTML159检视/开启
    Reducing Switching Activity by Test Slice Difference Technique for Test Volume Compression.pdf2338KbAdobe PDF278检视/开启

    在機構典藏中所有的数据项都受到原著作权保护.

    TAIR相关文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回馈