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    题名: Design of Dynamically Assignmentable TAM Width for Testing Core-Based SOCs
    作者: Rau, Jiann-Chyi;Chen, Chien-Shiun;Wu, Po-Han
    贡献者: 淡江大學電機工程學系
    关键词: SOC Testing;TAM;Testing Scheduling
    日期: 2006-12-04
    上传时间: 2011-10-23 21:13:11 (UTC+8)
    摘要: Test access mechanism (TAM) and testing schedule for system-on-chip (SOC) are challenging problems. Testing schedule must be effective to minimize testing time, under the constraint of test resources. This paper presents a new method based on generalized rectangle packing, as two-dimensional packing. A core cuts into many pieces and utilizes the design of reconfigurable core wrappers, and is dynamic to change the width of the TAM executing the core test. Therefore, a core can utilize different TAM width to complete test
    關聯: Circuits and Systems, 2006. APCCAS 2006. IEEE Asia Pacific Conference on, pp.1399-1402
    DOI: 10.1109/APCCAS.2006.342462
    显示于类别:[電機工程學系暨研究所] 會議論文

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