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    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/70312


    Title: An Filling Methodology for Efficient Compaction of Test Responses with Unknowns
    Authors: 饒建奇
    Contributors: 淡江大學電機工程學系
    Date: 2010-08-18
    Issue Date: 2011-10-23 21:09:46 (UTC+8)
    Relation: Proc. of VLSI Test Technology Workshop (VTTW), 宜蘭礁溪
    Appears in Collections:[電機工程學系暨研究所] 會議論文

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