A New Scheme of Reducing Shift and Capture Power Using the X-Filling Methodology

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題名:	A New Scheme of Reducing Shift and Capture Power Using the X-Filling Methodology
作者:	Chen, Tsung-tang;Li, Wei-lin;Wu, Po-han;Rau, Jiann-chyi
貢獻者:	淡江大學電機工程學系
關鍵詞:	At-Speed Scan Testing;DFT;X-Filling
日期:	2009-11-23
上傳時間:	2011-10-23 21:06:49 (UTC+8)
摘要:	A scheme that ATPG-based technique for reducing shift and capture power during scan testing is presented without any influence on fault coverage. This paper presents an X-filling approach called Adjacent Backtracing fill (AB-fill). After AB-fill approach for at-speed scan testing, all of test patterns have assigned as partially-specified values with a small number of don’t care bits (x) as in test compression, and it is integrated in the ATPG algorithm to reduce capture power while feeding the first test pattern into CUT.
關聯:	Proceedings of 2009 Asian Test Symposium(ATS '09), pp.105-110
DOI:	10.1109/ATS.2009.48
顯示於類別:	[電機工程學系暨研究所] 會議論文

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