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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/70265

    Title: A New Scheme of Reducing Shift and Capture Power Using the X-Filling Methodology
    Authors: Chen, Tsung-tang;Li, Wei-lin;Wu, Po-han;Rau, Jiann-chyi
    Contributors: 淡江大學電機工程學系
    Keywords: At-Speed Scan Testing;DFT;X-Filling
    Date: 2009-11-23
    Issue Date: 2011-10-23 21:06:49 (UTC+8)
    Abstract: A scheme that ATPG-based technique for reducing shift and capture power during scan testing is presented without any influence on fault coverage. This paper presents an X-filling approach called Adjacent Backtracing fill (AB-fill). After AB-fill approach for at-speed scan testing, all of test patterns have assigned as partially-specified values with a small number of don’t care bits (x) as in test compression, and it is integrated in the ATPG algorithm to reduce capture power while feeding the first test pattern into CUT.
    Relation: Proceedings of 2009 Asian Test Symposium(ATS '09), pp.105-110
    DOI: 10.1109/ATS.2009.48
    Appears in Collections:[電機工程學系暨研究所] 會議論文

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