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    题名: A New Scheme of Reducing Shift and Capture Power Using the X-Filling Methodology
    作者: Chen, Tsung-tang;Li, Wei-lin;Wu, Po-han;Rau, Jiann-chyi
    贡献者: 淡江大學電機工程學系
    关键词: At-Speed Scan Testing;DFT;X-Filling
    日期: 2009-11-23
    上传时间: 2011-10-23 21:06:49 (UTC+8)
    摘要: A scheme that ATPG-based technique for reducing shift and capture power during scan testing is presented without any influence on fault coverage. This paper presents an X-filling approach called Adjacent Backtracing fill (AB-fill). After AB-fill approach for at-speed scan testing, all of test patterns have assigned as partially-specified values with a small number of don’t care bits (x) as in test compression, and it is integrated in the ATPG algorithm to reduce capture power while feeding the first test pattern into CUT.
    關聯: Proceedings of 2009 Asian Test Symposium(ATS '09), pp.105-110
    DOI: 10.1109/ATS.2009.48
    显示于类别:[電機工程學系暨研究所] 會議論文

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