English  |  正體中文  |  简体中文  |  Items with full text/Total items : 62822/95882 (66%)
Visitors : 4016946      Online Users : 542
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/69195


    Title: GEE Modeling with Longitudinal Binary Data: Goodness-of-Fit Assessment via Local Polynomial Smoothing
    Authors: Lin, K. C.;Chen, Y. J.
    Contributors: 淡江大學統計學系
    Keywords: Bootstrap;GEE model;Goodness-of-fit;Logistic regression;Longitudinal binary data;Nonparametric smoothing
    Date: 2009-03-01
    Issue Date: 2011-10-23 16:33:56 (UTC+8)
    Abstract: Analysis of longitudinal binary data is often accomplished by using GEE methodology to estimate the marginal model parameters. Most of current goodness-of-fit tests for GEE models have been studied in parametric situations. In this article, we consider to develop an alternative assessment for GEE models utilizing nonparametric technique. The proposed test avoided the explosion of a large number of additional parameters and dependence on partition of covariate space. Even though exact expectation and variance of the proposed test statistic are analytically and computationally infeasible, approximated values based on bootstrap data are employed. The asymptotic distribution of the proposed test statistic in terms of a scaled chi-squared distribution, and comparison of the proposed test and the current methods with respect to power are discussed by simulation studies. In addition, the testing procedure is illustrated by a medical study from Koch et al. [12].
    Relation: International Journal of Intelligent Technology ; Applied Statistics 2, pp.77-88
    DOI: 10.6148/IJITAS.2009.0201.06
    Appears in Collections:[統計學系暨研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat
    GEE Modeling with Longitudinal Binary Data Goodness-of-Fit Assessment via Local Polynomial Smoothing.pdf4374KbAdobe PDF1View/Open
    index.html0KbHTML48View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback