English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 49621/84835 (58%)
造訪人次 : 7688667      線上人數 : 72
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/65294

    題名: Development of a Non-contact Tool Setting System for Precision Diamond Turning
    作者: Chao, C.L.;Cheng, T.A.;Lou, D.C.;Chao, C.W.
    貢獻者: 淡江大學機械與機電工程學系
    關鍵詞: Edge Detection;Precision Diamond Turning;Tool Setting
    日期: 200601
    上傳時間: 2011-10-20 21:37:49 (UTC+8)
    摘要: Precise and efficient tool setting technique and accurate tool shape monitoring are of essential importance in ultra-precision diamond turning operation. The traditional way of tool setting are typically laborious, inefficient and rely heavily on experience. A big part of the tool setting is done by using a contact probe such as LVDT. The contact tool setting station can normally, depending on the resolution of the probes, place the tool tip to within a 1~10μm positioning accuracy. However, it is running the risk of damage the delicate tool tip and has the ambiguity introduced by contact point of tool and touch probe. The optical/non-contact way of setting the tool do have the advantage of not having to touch the tool, but its resolution is limited by the optical diffraction limit and the resolution of the CCD device used (mm/pixel). A non-contact precision tool setting system is developed and built in this study using edge-detection image processing and sub-pixel dividing techniques in conjunction with CNC controller of the precision turning machine to improve the system presently available. Depending on the sampling distance of the images, the error band gets wider when the sampling step becomes larger. In the case of 0.1μm sampling distance the obtained error band was within ±0.1μm and the results showed that tools of different shapes namely round, half-round and sharp tool could all be positioned to within an error band of ±0.1μm by using the developed tool setting system.
    關聯: Materials Science Forum 505-507, pp.367-372
    DOI: 10.4028/www.scientific.net/MSF.505-507.367
    顯示於類別:[機械與機電工程學系暨研究所] 期刊論文


    檔案 大小格式瀏覽次數



    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋