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    題名: Increasing Detectability in Semiconductor Foundry by Multivariate Statistical Process Control
    作者: Niu, Han-jen;Yang, Chyan;Chang, Chao-jung
    貢獻者: 淡江大學經營決策學系
    關鍵詞: statistical process control (SPC), advance process control (APC), fault detection and classification (FDC), Hotelling T2 , principal component analysis (PCA), semiconductor industry
    日期: 2008-06-01
    上傳時間: 2011-10-20 16:32:47 (UTC+8)
    摘要: Quality has become a key determinant of success in all aspects of modern industries. It is especially prominent in the semiconductor industry. This paper reviews the contributions of statistical analysis and methods to modern quality control and improvement. The two main areas are statistical process control (SPC) and experimentation. The statistical approach is placed in the context of recent developments in quality management, with particular reference to the total quality movement.

    In SPC, Hotelling T2 has been applied in laboratories with good result; however, it is rarely used in mass production, especially in the semiconductor industry. An advance process control (APC) of R&D study, involving Hotelling T2 and principal component analysis (PCA), is performed on a high density plasma chemical vapour deposition (HDP CVD) equipment in the 12-inch wafer fab. The design of experiment (DOE) of gas flow and RF power effects is used to work the feasibility of PCA for SPC and examine the correlation among tool parameters. In this work, the Hotelling T2 model is shown to be sensitive to variations as small as (+/ − )5% in the tool parameters. Compared with classical PDCA and qualitative analysis, applying statistical in process control is more effective and indeed necessary. This model also is especially suitable to the semiconductor industry.
    關聯: Total Quality Management & Business Excellence 19(5), pp.429-440
    DOI: 10.1080/14783360802018079
    顯示於類別:[管理科學學系暨研究所] 期刊論文

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