淡江大學機構典藏:Item 987654321/62377
English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 62797/95867 (66%)
造訪人次 : 3736815      線上人數 : 383
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/62377


    題名: Theoretical simulations of a propagating crack subjected to in-plane stress wave loading by caustic method
    作者: Ing, Yi-Shyong;Ma, Chien-Ching
    貢獻者: 淡江大學航空太空工程學系
    關鍵詞: Caustic method;Stress intensity factor;Stress wave;Crack propagation
    日期: 1997-06
    上傳時間: 2013-03-20 16:33:45 (UTC+8)
    出版者: Dordrecht: Springer Netherlands
    摘要: The optical method of caustics for measuring the dynamic stress intensity factor in a transient process is investigated in this study. The transient full-field solutions of a propagating crack contained in an infinite medium subjected to step-stress wave and ramp-stress wave loadings are used to establish the exact equations of the initial and caustic curves. The results of the stress intensity factor obtained from the caustic method are compared with theoretical predictions and some experiments. The results demonstrate that a significant deviation can occur in the determination of the dynamic stress intensity factor from shadow spot measurements. The factors, such as screen distance, magnitude of loading, crack speed and rising time which can influence the accuracy of the experimental measurements are discussed in detail. In addition, the valid region of the dynamic stress singular field for the propagating crack is discussed in detail and it gives a better understanding of the appropriate region of measurements for investigators.
    關聯: International Journal of Fracture 85(4), pp.313-331
    DOI: 10.1023/A:1007446315960
    顯示於類別:[航空太空工程學系暨研究所] 期刊論文

    文件中的檔案:

    檔案 大小格式瀏覽次數
    index.html0KbHTML269檢視/開啟

    在機構典藏中所有的資料項目都受到原著作權保護.

    TAIR相關文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋