English  |  正體中文  |  简体中文  |  Items with full text/Total items : 54051/88873 (61%)
Visitors : 10548929      Online Users : 22
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/61044


    Title: Power-aware compression scheme for multiple scan-chain
    Authors: Rau, Jiann-Chyi;Wu, Po-Han
    Contributors: 淡江大學電機工程學系
    Keywords: scan based testing;low power testing;test data compression;design for testability (DfT)
    Date: 2011-06
    Issue Date: 2011-10-15 01:17:53 (UTC+8)
    Publisher: Abingdon: Taylor & Francis Ltd.
    Abstract: As test data continues to grow quickly, test cost also increases. For the sake of decreasing the test cost, this article presents a new data dependency compression scheme for large circuit which is based on multiple scan chains. We propose new compression architecture with fixed length for running tests. In results, when the complexity of a VLSI circuit is growing, the number of input pins for testing is very low. Since test data in power aware is not changed frequently, we use a selector to filter the unnecessary status and buffers to hold the back data. We also propose a new algorithm to assign multiple scan chains and an improved linear dependency compute method to find the hidden dependency between scan chains. Experimental results show that the proposed method can reduce both test data volume and shift-in power.
    Relation: Journal of the Chinese Institute of Engineers 34(4), pp.515-527
    DOI: 10.1080/02533839.2011.576498
    Appears in Collections:[Graduate Institute & Department of Electrical Engineering] Journal Article

    Files in This Item:

    File SizeFormat
    0253-3839_34(4)p515-527.pdf2462KbAdobe PDF98View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback