Electronic structure study of the bases in DNA duplexes by in situ photon-in/photon-out soft X-ray spectroscopy

doi:10.1016/j.elspec.2010.05.014

淡江大學機構典藏 > 理學院 > 物理學系暨研究所 > 期刊論文 > Item 987654321/58295

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題名:	Electronic structure study of the bases in DNA duplexes by in situ photon-in/photon-out soft X-ray spectroscopy
作者:	Guo, J. H.;Kastanov, S.;Soderstrom, J.;Glans, P. A.;West, M.;Learmonth, T.;Chiou, J. W.;Luo, Y.;Nordgren, J.;Smith, K.;Pong, W. F.;Cheng, H.;Griffiss, J. M.
貢獻者:	淡江大學物理學系
關鍵詞:	Soft X-ray absorption and emission spectroscopy;RIXS;Electronic structure;DNA;G–C pair;A–T pair
日期:	2010-08
上傳時間:	2011-09-30 22:00:29 (UTC+8)
出版者:	Amsterdam: Elsevier BV
摘要:	Understanding protein functionality is of fundamental importance in biochemistry. Soft X-ray transitions, where the core-level vacancies are filled by the valence-orbital electrons, give direct information about the chemical bonding. Soft X-ray absorption and emission study of poly(dG) -poly(dC) in aqueous solutions can elucidate the relation between the structure and functionality of proteins. We report the N K-edge soft X-ray absorption (XAS) and resonant soft X-ray emission spectroscopy (XES) to characterize the electronic structure near the Fermi level of DNA duplexes to specify the charge migration mechanism. Since N atoms are included in only bases in DNA duplexes, the XES spectra excited from N 1s to unoccupied states purely extract the electronic orbital features of the bases in DNA. The fact that N atoms in different bonding environments form well-defined structure has been determined. The experimental findings provide the evidence for the charge-hopping and/or charge-transfer effects in understanding of electric conduction in DNA duplexes when electrons pass through the π* states of DNA bases.
關聯:	Journal of Electron Spectroscopy and Related Phenomena 181(2-3), pp.197–201
DOI:	10.1016/j.elspec.2010.05.014
顯示於類別:	[物理學系暨研究所] 期刊論文

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