淡江大學機構典藏:Item 987654321/58134
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 55542/89862 (62%)
Visitors : 11011535      Online Users : 27
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/58134


    Title: Optimal step-stress accelerated degradation test plan for gamma degradation processes
    Authors: Tseng, Sheng-tsaing;Balakrishnan, N.;Tsai, Chih-chun
    Contributors: 淡江大學數學學系
    Date: 2009-12
    Issue Date: 2011-09-29 20:40:25 (UTC+8)
    Publisher: IEEE Reliability Society
    Abstract: Step-stress accelerated degradation testing (SSADT) is a useful tool for assessing the lifetime distribution of highly reliable products (under a typical-use condition) when the available test items are very few. Recently, an optimal SSADT plan was proposed based on the assumption that the underlying degradation path follows a Wiener process. However, the degradation model of many materials (especially in the case of fatigue data) may be more appropriately modeled by a gamma process which exhibits a monotone increasing pattern. Hence, in practice, designing an efficient SSADT plan for a gamma degradation process is of great interest. In this paper, we first introduce the SSADT model when the degradation path follows a gamma process. Next, under the constraint that the total experimental cost does not exceed a pre-specified budget, the optimal settings such as sample size, measurement frequency, and termination time are obtained by minimizing the approximate variance of the estimated MTTF of the lifetime distribution of the product. Finally, an example is presented to illustrate the proposed method.
    Relation: IEEE Transactions on Reliability 58(4), pp.611-618
    DOI: 10.1109/TR.2009.2033734
    Appears in Collections:[Graduate Institute & Department of Mathematics] Journal Article

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML184View/Open
    index.html0KbHTML8View/Open
    Optimal step-stress accelerated degradation test plan for gamma degradation processes.pdf231KbAdobe PDF0View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback