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日期
題名
作者
2007-06
On the Behavior of the First Eigenvalue of the Spherical Laplacian Operator on a Spherical Annulus
謝忠村
;
Shieh, Chung-tsun
2011-05-20
On the Maximal Q-index Problem
譚必信
;
Tam, Bit-shun
2013-07-17
On The Quenching Problem Arising in The Micro-Electro Mechanical System
Guo, Jong-Shenq
2013-06
On the signless Laplacian coefficients of unicyclic graphs
譚必信
2013-07
On the signless Laplacian coefficients of unicyclic graphs
譚必信
1988-08
On the unitary bordism ring U*(Zp) Zp
吳青木
;
Wu, Ching-mu
2013-08
On Visualization of Fuzzy Clustering Results
吳漢銘
1987-06
On Z/p bordism rings
吳青木
;
Wu, Ching-mu
2003-12
One Point Test for Mixed Volume Computation
吳孟年
;
Wu, Meng-nien
1997-01
One-stage analysis of variance and range test for 2-way model under heteroscedasticity
陳順益
;
Chen, Shun-yi
2002-10
Optimal confidence intervals for the largest exponential location parameter
陳順益
;
Chen, Shun-yi
;
Chen, H. J.
2011-12-28
Optimal Design for Degradation Tests Based on Gamma Degradation Process with Random Effects
蔡志群
2013-04-22
Optimal Design for Accelerated Destructive Degradation Tests
蔡志群
2013-06
Optimal Design for Accelerated Destructive Degradation Tests
林千代
2020-12-05
Optimal Design for Accelerated-Stress Acceptance Test
Tsai, Chih-Chun
;
Lin, Chien-Tai
;
Balakrishnan, Narayanaswamy
2020-12-05
Optimal Design for Accelerated-Stress Acceptance Test
Tsai, C. C.
;
Balakrishnan, N.
;
Lin, C. T.
2014-06-11
Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process
蔡志群
2015-05-30
Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process
Tsai, C. C.
;
Balakrishnan, N.
;
Lin, C. T.
2015-08-08
Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process
Tsai, C. C.
;
Balakrishnan, N.
;
Lin, C. T.
2015-06-03
Optimal design for accelerated-stress acceptance test based on wiener process
林千代
2012-06-23
Optimal Design for Gamma Degradation Processes with Random Effects
蔡志群
2014-08-21
Optimal Selection of the Most Reliable Design Based on Gamma Degradation
蔡志群
2014-06-30
Optimal Selection of the Most Reliable Design Based on Gamma Degradation Processes
蔡志群
2018-07-28
Package mTEXO for testing the presence of outliers in exponential samples
Lin, Chien-tai
;
Lee, Ying-chen
;
Balakrishnan, Narayanaswamy
1912
Parameter estimate for dynamic population growth in the presence of observation errors
Chen, Chu-chih
;
陳主智
;
Hsieh, Fu-shing
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