English  |  正體中文  |  简体中文  |  Items with full text/Total items : 62805/95882 (66%)
Visitors : 3930248      Online Users : 770
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/55638


    Title: Dark side of relationships: A tensions-based view
    Authors: Fang, Shyh-rong;Chang, Yong-sheng;Peng, Yan-chiun
    Contributors: 淡江大學企業管理學系
    Keywords: Relationship marketing;Dark side of relationships;Tensions-based view;Trust;Commitment
    Date: 2011-07
    Issue Date: 2011-08-24 16:04:40 (UTC+8)
    Publisher: New York: Elsevier Inc.
    Abstract: By drawing on the tensions-based view to depict the components of the dark side of relationships, this study presents a conceptual model explaining how the dark side of relationships can moderate the positive relationship between relationship quality and relationship function. The authors test the hypotheses via a mail survey involving 136 manufacturing firms. The results support the hypotheses, which posit that relationship quality is positively associated with relationship function. Moreover, the empirical results partially support the argument of the author that the influence of relationship quality on relationship function is strengthened or weakened when three relationship tensions (namely, behavioral, structural, and psychological tension) are balanced or imbalanced. Theoretical and managerial implications are extracted from this study, and potential future research directions.
    Relation: Industrial Marketing Management 40(5), pp.774-784
    DOI: 10.1016/j.indmarman.2011.02.003
    Appears in Collections:[企業管理學系暨研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat
    0019-8501_40(5)p774-784.pdf584KbAdobe PDF340View/Open
    0019-8501_40(5)p774-784.pdf584KbAdobe PDF1View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback