淡江大學機構典藏:Item 987654321/55082
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    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/55082


    Title: Reconstruction of the Buried Homogenous Dielectric Cylinder by FDTD and Asynchronous Particle Swarm Optimization
    Authors: Huang, Chung-Hsin;Chen, Chien-Hung;Chiu, Chien-Ching;Li, Ching-Lieh
    Contributors: 淡江大學電機工程學系
    Keywords: APSO;FDTD;Inverse scattering;Subgridding FDTD;Time domain
    Date: 2010-08
    Issue Date: 2011-08-10 20:10:19 (UTC+8)
    Publisher: Miami: Applied Computational Electromagnetics Society, Inc.
    Abstract: In this paper, a time domain microwave imaging technique for resconstructing the electromagnetic properties of a buried homogeneous dielectric cylinder based on the finite difference time domain(FDTD) method and the asynchronous particle swarm optimization(APSO) are presented. The homogeneous dielectric cylinder with unknown electromagnetic properties is illuminated by transverse magnetic pulse and the scattered field is recorded outside. The idea is to minimize the errors between two E field data such that the location, shape and permittivity of the dielectric cylinder can be reconstructed through the APSO scheme. The first E field data are obtained in the forward problem by FDTD code with fine grids to mimic the experiment measurement data, while the second E field data are obtained in the inverse problem is resolve by an optimization approach, and the global searching scheme APSO is then employed to search the parameter space. A set of representative numerical results is presented for demonstrating that the proposed approach is able to efficiently reconstruct the electromagnetic properties of homogenous dielectric scatterer even when the initial guess is far away from the exact one. In addition, the effects of Gaussian noises on imaging reconstruction are also investigated.
    Relation: Applied Computational Electromagnetics Society Journal 25(8), pp.672-681
    Appears in Collections:[Graduate Institute & Department of Electrical Engineering] Journal Article

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