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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/54203

    Title: 測試機記憶體不足的解決方法
    Other Titles: Ate memory insufficient solution
    Authors: 簡世超;Chien, Shih-Chao
    Contributors: 淡江大學電機工程學系碩士在職專班
    饒建奇;Rau, Jiann-Chyi
    Keywords: 記憶體模組;自動化測試設備;PATTERN MEMORY;ATE
    Date: 2011
    Issue Date: 2011-06-16 22:09:44 (UTC+8)
    Abstract: 台灣的封裝廠因客戶的需求所以半導體測試機台的功能不斷的提升,但是測試機台的成本相對的提高對於一般的半導體設計公司無法負荷如此高的成本,但為了節省成本多數的半導體設計公司還是會使用價格較低的機台量產,所以會使用許多方法讓現有的半導體測試機台可以量產例如Rolling Code [1]的量產及Memory Test[2],已上兩種的測試需求較早期的半導體測試機台因記憶體的大小限制而無法逹到量產的需求,為了決解機台上的限制就必需對測試機台本身所制定的量產條件加以更動,讓半導體測試機台可以逹到量產的目的.
    Packaging factory in Taiwan customer demand to the function of ATE continue to improve, but the ATE is relatively higher cost of semiconductor design companies in general can not load such a high cost, but to save the cost of most of the semiconductor design company will still use the lower price mass production machine, it will use many ways to make existing semiconductor production test machine for mass production such as Rolling Code [1]and Memory Test[2], test requirements has been the earlier of two ATE sets limits for the size of the memory can not Tat to production needs, solutions must drive the stage to restrictions on the test machine itself must be formulated to change the production conditions, so that the ATE can achieve a production purposes.
    Described in this paper two kinds of ATE V7 [4], SC [3]the functions and memory test machine to replace the application mode.
    Appears in Collections:[Graduate Institute & Department of Electrical Engineering] Thesis

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