English  |  正體中文  |  简体中文  |  Items with full text/Total items : 62637/95499 (66%)
Visitors : 3028836      Online Users : 484
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/53878


    Title: 非取樣式之Q值量測裝置與方法
    Other Titles: Apparatus and method of non-sampling-based Q-factor measuring
    Authors: 楊淳良;李三良;徐達儒
    Contributors: 淡江大學電機工程學系
    Date: 2006-12-01
    Issue Date: 2011-05-20 15:37:20 (UTC+8)
    Abstract: 本發明提供一種非取樣式之Q值量測裝置與方法,藉由一光功率轉換模組,將光訊號在時域上之光功率變化轉換在非時域上之領域的變化,取代複雜的取樣的機制,來量測Q值。訊號功率在時域上之變化可以轉換至光波長、光極性和光元件不同輸出埠等領域。以光波長為例,不同準位的輸入光功率變化經一功率至波長轉換模組,會反映在不同輸出光波長上的變化,再利用一分光器,將不同顏色波長的光分開,再經過一低頻的檢光器,就可以統計不同顏色光的平均光功率。藉此來得知輸入光訊號在準位1/0上光功率變化的情形,進而可以計算出Q值。
    Appears in Collections:[Graduate Institute & Department of Electrical Engineering] Patent

    Files in This Item:

    There are no files associated with this item.

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback