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    题名: Using essential patent index and essential technological strength to evaluate industrial technological innovation competitiveness
    作者: Chen, Dar-zen;Lin, Wen-yau Cathy;Huang, Mu-Hsuan
    贡献者: 淡江大學資訊與圖書館學系
    日期: 2007-04
    上传时间: 2011-05-20 09:45:15 (UTC+8)
    出版者: Springer
    摘要: The aim of this article is to develop new patent indicators for evaluating technological innovation competitiveness between companies. A novel indicator representing an industrial's patent performance, Essential Patent Index (EPI), was developed by incorporating information on who cited these patents and when these patents were cited, based on the assumption that both contribute to meaningful quality assessment. By combining EPI and Chi's well known Technological Strength (TS) indicator, a second novel indicator Essential Technological Strength (ETS) was developed to represent the innovation competitiveness of an individual company. In this study, patent performance of three high-tech industries in Taiwan were analyzed using ETS as well as the traditional TS for comparison. Results from this analysis demonstrated that ETS provided better insights by clearly verifying the latent influence of citations, reinforcing the impact of essential patents, and aggrandizing the differences of innovation competitiveness between companies.
    關聯: Scientometrics 71(1), pp.101-116
    DOI: 10.1007/s11192-007-1655-6
    显示于类别:[資訊與圖書館學系暨研究所] 期刊論文

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