English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 56562/90363 (63%)
造访人次 : 11860154      在线人数 : 106
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻

    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/53555

    题名: Using essential patent index and essential technological strength to evaluate industrial technological innovation competitiveness
    作者: Chen, Dar-zen;Lin, Wen-yau Cathy;Huang, Mu-Hsuan
    贡献者: 淡江大學資訊與圖書館學系
    日期: 2007-04
    上传时间: 2011-05-20 09:45:15 (UTC+8)
    出版者: Springer
    摘要: The aim of this article is to develop new patent indicators for evaluating technological innovation competitiveness between companies. A novel indicator representing an industrial's patent performance, Essential Patent Index (EPI), was developed by incorporating information on who cited these patents and when these patents were cited, based on the assumption that both contribute to meaningful quality assessment. By combining EPI and Chi's well known Technological Strength (TS) indicator, a second novel indicator Essential Technological Strength (ETS) was developed to represent the innovation competitiveness of an individual company. In this study, patent performance of three high-tech industries in Taiwan were analyzed using ETS as well as the traditional TS for comparison. Results from this analysis demonstrated that ETS provided better insights by clearly verifying the latent influence of citations, reinforcing the impact of essential patents, and aggrandizing the differences of innovation competitiveness between companies.
    關聯: Scientometrics 71(1), pp.101-116
    DOI: 10.1007/s11192-007-1655-6
    显示于类别:[資訊與圖書館學系暨研究所] 期刊論文


    档案 描述 大小格式浏览次数
    Using Essential Patent Index and Essential Technological Strength to evaluate industrial technological innovation competitiveness.pdf110KbAdobe PDF1检视/开启



    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回馈