淡江大學機構典藏:Item 987654321/53090
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    題名: Electronic Structure Study of Nanostructured Transition Metal Oxides Using Soft X-Ray Spectroscopy
    作者: Guo, Jing-hua;Per-anders Glans;Liu, Yi-sheng;Chang, Ching-lin
    貢獻者: 淡江大學物理學系
    關鍵詞: XAS;XES;RIXS;Electronic structure;Bandgap;Dd-excitation;Synchrotron radiation;In-situ study;TiO2;Li doped TiO2;Hydrogen storage;SWNT
    日期: 2010-03
    上傳時間: 2010-12-23 13:55:53 (UTC+8)
    出版者: Singapore : John Wiley & Sons(Asia)
    摘要: In this chapter, we introduce the basics of soft x-ray absorption (XAS) and emission spectroscopy (XES), and resonant inelastic soft x-ray scattering (RIXS) followed by description of instrumentation including beamline, ensdtation, and spectrometer. Chemical cells are designed for in-situ electronic structure study of samples in gas or liquid environment. The application of XAS, XES, and RIXS on TiO2 crystals of rutile and anatase phases have yielded characteristic fingerprints that provide the information on geometric structure, bandgap, doping effects. A number of in-situ electronic structure studies are also addressed.
    關聯: On Solar Hydrogen and Nanotechnology, pp.123-142
    DOI: 10.1002/9780470823996.ch5
    顯示於類別:[物理學系暨研究所] 專書之單篇

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