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    题名: Electronic Structure Study of Nanostructured Transition Metal Oxides Using Soft X-Ray Spectroscopy
    作者: Guo, Jing-hua;Per-anders Glans;Liu, Yi-sheng;Chang, Ching-lin
    贡献者: 淡江大學物理學系
    关键词: XAS;XES;RIXS;Electronic structure;Bandgap;Dd-excitation;Synchrotron radiation;In-situ study;TiO2;Li doped TiO2;Hydrogen storage;SWNT
    日期: 2010-03
    上传时间: 2010-12-23 13:55:53 (UTC+8)
    出版者: Singapore : John Wiley & Sons(Asia)
    摘要: In this chapter, we introduce the basics of soft x-ray absorption (XAS) and emission spectroscopy (XES), and resonant inelastic soft x-ray scattering (RIXS) followed by description of instrumentation including beamline, ensdtation, and spectrometer. Chemical cells are designed for in-situ electronic structure study of samples in gas or liquid environment. The application of XAS, XES, and RIXS on TiO2 crystals of rutile and anatase phases have yielded characteristic fingerprints that provide the information on geometric structure, bandgap, doping effects. A number of in-situ electronic structure studies are also addressed.
    關聯: On Solar Hydrogen and Nanotechnology, pp.123-142
    DOI: 10.1002/9780470823996.ch5
    显示于类别:[物理學系暨研究所] 專書之單篇

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