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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/5257


    Title: X光磁性圓振二向色性與X光吸收細微結構對 Ni-Zn Ferrites與過渡金屬/半導體薄膜研究
    Other Titles: X-ray Magnetic Circular Dichroism & X-ray Absorption Fine Structure Study of Ni-Zn Ferrite and Transition Metal/Semiconductor Thin Films
    Authors: 彭維鋒
    Contributors: 淡江大學物理學系
    Keywords: X光;薄膜;吸收;細微結構;X-ray;Thin film;Absorption;Fine structure
    Date: 1995
    Issue Date: 2009-03-16 12:00:18 (UTC+8)
    Abstract: 本計畫在未來兩年中將從事兩主要研究領 域:利用同步輻射X光磁性圓振二向色性(X-ray Magnetic Circular Dichroism,XMCD)與X光吸收細微結構( X-ray Absorption Fine Structure,XAFS),研究(1)Ni-ZnFerrites與(2)過渡金屬/半導體薄膜系統,以期了 解相關磁性現象與原子幾何結構及電子能態結 構.
    Appears in Collections:[物理學系暨研究所] 研究報告

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