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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/5235

    Title: (小角度入射)X光吸收光譜對Si-Co與Si/Co/al界面研究
    Other Titles: Study of Si-Co System and Si/Co/Al Interface Using XAFS and Glancing- Incidence EXAFS
    Authors: 彭維鋒;鄭伯昆
    Contributors: 淡江大學物理學系
    Keywords: 吸收光譜;界面;X光;Absorption Spectrum;Interface;X ray
    Date: 1994
    Issue Date: 2009-03-16 11:59:17 (UTC+8)
    Abstract: 利用同步輻射光源,以X光吸收細微結構( XAFS)與小角度延伸X光吸收細微結構 (Glancing- incidence EXAFS)對Si-Co與Si-Co-Al系統研究.主要研究 課題是了解不同物質其界面間之電子能態結構 及界面間之原子結構.同時,我們欲在淡大物理 系建立一套小型分子磊晶(Mini molecular beam epitaxy)樣品長成系統.
    Appears in Collections:[物理學系暨研究所] 研究報告

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