(小角度入射)X光吸收光譜對Si-Co與Si/Co/al界面研究

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Title:	(小角度入射)X光吸收光譜對Si-Co與Si/Co/al界面研究
Other Titles:	Study of Si-Co System and Si/Co/Al Interface Using XAFS and Glancing- Incidence EXAFS
Authors:	彭維鋒;鄭伯昆
Contributors:	淡江大學物理學系
Keywords:	吸收光譜;界面;Ｘ光;Absorption Spectrum;Interface;X ray
Date:	1994
Issue Date:	2009-03-16 11:59:17 (UTC+8)
Abstract:	利用同步輻射光源,以Ｘ光吸收細微結構( XAFS)與小角度延伸Ｘ光吸收細微結構 (Glancing- incidence EXAFS)對Si-Co與Si-Co-Al系統研究.主要研究課題是了解不同物質其界面間之電子能態結構及界面間之原子結構.同時,我們欲在淡大物理系建立一套小型分子磊晶(Mini molecular beam epitaxy)樣品長成系統.
Appears in Collections:	[Graduate Institute & Department of Physics] Research Paper

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