English  |  正體中文  |  简体中文  |  Items with full text/Total items : 49199/83641 (59%)
Visitors : 7095073      Online Users : 48
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/5235


    Title: (小角度入射)X光吸收光譜對Si-Co與Si/Co/al界面研究
    Other Titles: Study of Si-Co System and Si/Co/Al Interface Using XAFS and Glancing- Incidence EXAFS
    Authors: 彭維鋒;鄭伯昆
    Contributors: 淡江大學物理學系
    Keywords: 吸收光譜;界面;X光;Absorption Spectrum;Interface;X ray
    Date: 1994
    Issue Date: 2009-03-16 11:59:17 (UTC+8)
    Abstract: 利用同步輻射光源,以X光吸收細微結構( XAFS)與小角度延伸X光吸收細微結構 (Glancing- incidence EXAFS)對Si-Co與Si-Co-Al系統研究.主要研究 課題是了解不同物質其界面間之電子能態結構 及界面間之原子結構.同時,我們欲在淡大物理 系建立一套小型分子磊晶(Mini molecular beam epitaxy)樣品長成系統.
    Appears in Collections:[物理學系暨研究所] 研究報告

    Files in This Item:

    There are no files associated with this item.

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback