淡江大學機構典藏:Item 987654321/50695
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 62822/95882 (66%)
Visitors : 4017060      Online Users : 556
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/50695


    Title: Troubled Asset Relief Program, Bank Interest Margin and Default Risk in Equity Return: An Option-Pricing Model
    Authors: 林志娟;Lin, Jyh-Jiuan;Chang, Ching-hui;林志鴻;Lin, Jyh-horng
    Contributors: 淡江大學國際貿易學系
    Keywords: default risk;interest margin;toxic loans;troubled asset relief program
    Date: 2009-03
    Issue Date: 2010-08-10 15:13:51 (UTC+8)
    Publisher: World Scientific and Engineering Academy and Society (WSEAS)
    Abstract: Will banks be willing to sell their toxic loans with the help of the Troubled Asset Relief Program (TARP)? The answer is yes as long as bids are high enough to tempt banks to deal. With the TARP's help, an increase in the toxic loans sold to the government increases the bank's margin and decreases the bank's default probability in equity return when the bank encounters greater risk. This paper concludes that setting up the TARP for the 'bad bank' solution may be a good move for retail banking, resulting in high margin and low default risk when its target banks are willing sellers.
    Relation: WSEAS Transactions on Mathematics 8(3), pp.117-126
    Appears in Collections:[Graduate Institute & Department of International Business] Journal Article

    Files in This Item:

    File Description SizeFormat
    1109-2769_8(3)p117-126.pdf381KbAdobe PDF44View/Open
    index.html0KbHTML163View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback