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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/50409

    Title: Locally optimal tests for exponential distributions with type-I censoring
    Authors: Liang, Tachen;黃文濤;Huang, Wen-tao;Yang, Kun-cheng
    Contributors: 淡江大學經營決策學系
    Date: 2008-03
    Issue Date: 2010-08-09 17:02:19 (UTC+8)
    Publisher: Amsterdam: Elsevier BV
    Abstract: This article studies a locally optimal test φ* for testing H0:θ≥θ0 versus H1:θ<θ0 for the lifetime parameter θ in an exponential distribution based on type-I censored data. Certain properties associated with φ* are addressed. We compare the performance of φ* with that of Spurrier and Wei’s [Spurrier, J.D., Wei, L.J., 1980. A test of the parameter of the exponential distribution in the type-I censoring case. J. Amer. Statist. Assoc. 75, 405–409] test φSW, which is based on the MLE of θ. The exact powers and asymptotic powers of φ* and φSW are computed. The numerical results indicate that the power of φ* is better than that of φSW when θ(0<θ<θ0) is close to θ0.
    Relation: Computational Statistics and Data Analysis 52(7), pp.3603-3615
    DOI: 10.1016/j.csda.2007.11.015
    Appears in Collections:[管理科學學系暨研究所] 期刊論文

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