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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/46999


    Title: 利用單樣本及雙樣本資料對Burr type X分配之未來有序觀測值的貝氏預測區間估計與應用
    Other Titles: Bayesian Predictive Interval of Future Ordered Observations for the Burr Type X Distribution Based on One-Sample and Two-Sample Data
    Authors: 吳錦全
    Contributors: 淡江大學統計學系
    Keywords: Burr type X 分配;右型II 設限;排序集合抽樣;貝氏預測;Burr type X distribution;Type II censoring;Rank set sampling;Bayesianprediction
    Date: 2009
    Issue Date: 2010-04-15 15:54:01 (UTC+8)
    Abstract: 當進行產品可靠度的分析及改善時,通常需要做產品的抽樣壽命實驗,希望能利用 已觀測到的產品壽命來預測尚未發生故障的樣本壽命。本文假設所取得的樣本型態分兩 種,第一種資料型態為右型II 設限樣本觀測值,第二種資料型態為排序集合樣本,在所 取得的樣本壽命觀測值下,利用貝氏方法預測未來產品發生故障的壽命區間。 本計畫主要分為兩部份,第一部份探討當產品樣本壽命服從Burr type X 分配的右型 II 設限樣本Y(1) < Y(2) < K < Y(r ),給定在最後一筆失效的樣本觀測值Y(r ),預測同一條生 產線上尚未發生故障元件的壽命區間,此情形稱為單樣本預測;第二部份探討產品樣本 壽命服從Burr type X 分配的排序集合樣本,得到的資料為整組樣本的主對角線觀測值 { (11) X , (22) X ,…, (nn) X },利用給定在第i (1 ≤ i ≤ n )個發生故障的排序集合樣本之下,預測 另一條生產線第s (1 ≤ s ≤ m )個尚未發生故障元件的壽命區間,此情形稱為雙樣本預 測。同時分別利用電腦模擬資料加以數值計算與分析。 In the researching on the reliability of products and improvement, usually need to carry out life test. During life testing, the future observations in an ordered sample are often expected to be predicted. In this plan, we have two different data types: one is under the type II censored samples, the other is ranked set samples. We adopted Bayesian method to obtain the prediction intervals of future ordered observation for the products. This paper presents two parts, one is under the type II censored sample Y(1) < Y(2) K
    Appears in Collections:[統計學系暨研究所] 研究報告

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