淡江大學機構典藏:Item 987654321/46253
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    题名: CGIN: a fault tolerant modified Gamma interconnection network
    作者: 莊博任;Chuang, Po-jen
    贡献者: 淡江大學電機工程學系
    日期: 1996-12
    上传时间: 2010-03-26 21:42:38 (UTC+8)
    出版者: Piscataway: Institute of Electrical and Electronics Engineers (IEEE)
    摘要: To improve the terminal reliability of the Gamma interconnection network (GIN), we consider altering its connecting patterns between stages to attain multiple disjoint paths between any source and destination pair. The new modified GIN, referred to as a CGIN with connecting patterns between stages exhibiting a cyclic feature, is able to tolerate any arbitrary single fault and to lift up terminal reliability accordingly. If several rows of switching elements are fabricated in one chip using the VLSI technology, a CGIN could lead to reduced cost because the pin count per chip decreases and the layout area taken by connections shrinks. To make routing and rerouting in the CGIN more efficient and simpler to implement, destination tag routing and rerouting is also provided
    關聯: IEEE Transactions on Parallel and Distributed Systems 7(12), pp.1301-1306
    DOI: 10.1109/71.553298
    显示于类别:[電機工程學系暨研究所] 期刊論文

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