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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/46213


    Title: Determination of dielectric properties of materials using a coaxial cavity system driven by a coaxial line
    Authors: 李慶烈;Li, Ching-lieh;Chen, Kun-mu
    Contributors: 淡江大學電機工程學系
    Date: 1994-12-01
    Issue Date: 2010-03-26 21:17:52 (UTC+8)
    Publisher: Piscataway: Institute of Electrical and Electronics Engineers (IEEE)
    Abstract: In this paper, a new scheme for characterizing dielectric materials over a wide band of frequencies is presented. The scheme utilizes a coaxial cavity partially or completely filled with material and driven by a coaxial line. This system is analyzed by the mode-matching technique. The effect of the ohmic loss of the cavity wall on the characterization of the dielectric material is addressed. The permittivity of the filling material is inversely determined from the measured reflection coefficient of the incident TEM wave to the cavity
    Relation: IEEE transactions on Microwave theory and techniques 42(12), pp.2195-2200
    DOI: 10.1109/22.339742
    Appears in Collections:[電機工程學系暨研究所] 期刊論文

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