淡江大學機構典藏:Item 987654321/45983
English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 62797/95867 (66%)
造訪人次 : 3736854      線上人數 : 372
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/45983


    題名: Dynamic Full-Field Analysis of a Surface Crack Subjected to an Antiplane Moving Loading
    其他題名: 表面裂紋承受反平面移動動力載荷之暫態全場解析
    作者: 應宜雄;Ing, Yi-shyong;林瑞庭;Lin, Jui-ting
    貢獻者: 淡江大學航空太空工程學系
    關鍵詞: 動力破壞;表面裂紋;移動載荷;暫態波 Dynamic fracture;Surface crack;Moving loading;Transient wave
    日期: 2002-11
    上傳時間: 2013-07-11 11:55:52 (UTC+8)
    出版者: Taipei : Chinese Institute of Chemical Engineers
    摘要: In this study, the transient full-field solution of a surface crack subjected to a dynamic anti-plane moving loading is investigated. The solution is determined by superposition of proposed fundamental solutions in the Laplace transform domain. The fundamental solutions to be used are the problems for applying exponentially distributed traction and screw dislocations on the crack faces and along the crack tip line, respectively. The exact transient solutions of shear stresses and displacement are obtained and expressed in compact formulations. The solutions are valid for an infinite length of time and have accounted for the contributions of an infinite number of diffracted and reflected waves. Numerical calculations for both moving and stationary loading cases are evaluated and discussed in detail. The results indicate that the stresses will approach steady-state or static Solutions after the first few waves have passed through the receiver.
    關聯: Journal of the Chinese Institute of Engineers=中國工程學刊 25(6), pp.639-651
    DOI: 10.1080/02533839.2002.9670738
    顯示於類別:[航空太空工程學系暨研究所] 期刊論文

    文件中的檔案:

    檔案 大小格式瀏覽次數
    index.html0KbHTML218檢視/開啟

    在機構典藏中所有的資料項目都受到原著作權保護.

    TAIR相關文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋