淡江大學機構典藏:Item 987654321/45815
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 62834/95882 (66%)
Visitors : 4184756      Online Users : 425
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/45815


    Title: Development of an automatic surface finishing system (ASFS) with in-process surface topography inspection
    Authors: 陳炤彰;Chen, Chao-chang A.;Duffie, Neil A.
    Contributors: 淡江大學機械與機電工程學系
    Keywords: Surface finishing system;Surface topography;In-process inspection;Automation
    Date: 1996-12
    Issue Date: 2010-03-26 20:01:08 (UTC+8)
    Publisher: Elsevier
    Abstract: This paper describes an automated surface finishing system (ASFS) with in-process surface topography inspection. The acquired surface topography feedback is used to calculate the surface error and to generate the finishing paths for each level of surface finishing of molds and dies. A prototype ASFS was constructed with a CNC machining center, and a laser scanning probe was used in the ASFS to acquire the surface topography data. Surface finishing of a cylindrical-shaped mold cavity was used to verify the effectiveness of the prototype ASFS. Results showed that the surface error was improved toward the specified dimensional tolerance and surface finish.
    Relation: Journal of materials processing technology 62(4), pp.427-430
    DOI: 10.1016/S0924-0136(96)02447-8
    Appears in Collections:[Graduate Institute & Department of Mechanical and Electro-Mechanical Engineering] Journal Article

    Files in This Item:

    File Description SizeFormat
    0KbUnknown247View/Open
    Development of an automatic surface finishing system (ASFS) with in-process surface topography inspection.pdf442KbAdobe PDF1View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback