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    題名: A New Method for Goodness-of-Fit Testing Based on Type-II Right Censored Samples
    作者: Lin, Chien-Tai;Huang, Yen-Lung;Balakrishnan, N.
    貢獻者: 淡江大學數學學系
    關鍵詞: Empirical distribution function (EDF) statistics;goodness-of-fit testing;Monte Carlo simulation;order statistics;type-II censoring;uniform distribution
    日期: 2008-12
    上傳時間: 2010-01-28 07:06:59 (UTC+8)
    出版者: Piscataway: Institute of Electrical and Electronics Engineers (IEEE)
    摘要: We present a simple method for testing goodness-of-fit based on type-II right censored samples. Applying the property of order statistics due to Malmquist, we can transform any conventional type-II right censored sample of size r out of n from a uniform distribution to a complete sample of size r from a uniform distribution. This result is used to develop the proposed goodness-of-fit test procedure. The simulation studies reveal that the proposed approach provides as good or better overall power than the method of Michael & Schucany.
    關聯: IEEE Transactions on Reliability 57(4), pp.633-642
    DOI: 10.1109/TR.2008.2005860
    顯示於類別:[數學學系暨研究所] 期刊論文

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