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    題名: A timing-driven pseudo-exhaustive testing of VLSI circuits
    作者: Chang, S. C.;Rau, J. C.
    貢獻者: 淡江大學電機工程學系
    日期: 2000-05
    上傳時間: 2010-04-15 11:41:05 (UTC+8)
    出版者: Institute of Electrical and Electronics Engineers (IEEE)
    摘要: The object of this paper is to reduce the delay penalty of bypass storage cell (bsc) insertion for pseudo-exhaustive testing. We first propose a tight delay lower bound algorithm which estimates the minimum circuit delay for each node after bsc insertion. By understanding how the lower bound algorithm loses optimality, we can propose a bsc insertion heuristic which tries to insert bscs so that the final delay is as close to the lower bound as possible. Our experiments show that the results of our heuristic are either optimal because they are the same as the delay lower bounds or they are very close to the optimal solutions.
    關聯: Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on (Volume:2 ), pp.665-668
    DOI: 10.1109/ISCAS.2000.856416
    顯示於類別:[電機工程學系暨研究所] 會議論文

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