New York: Institute of Electrical and Electronics Engineers (IEEE)
摘要:
The terminal reliability is an important performance parameter in the design of a highly reliable multistage interconnection network (MIN). In this paper we present a new method which is able to evaluate the terminal reliability of any MIN, with a rather simplified procedure. Implementation considerations and discussions are also provided
關聯:
Circuits and Systems, 1994., Proceedings of the 37th Midwest Symposium on v.1, pp.313-316
