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    Title: A simple approach to the evaluation of multistage interconnection network reliability
    Authors: Chuang, Po-Jen;Kuo, Chun-Liang
    Contributors: 淡江大學電機工程學系
    Date: 1994-08
    Issue Date: 2013-03-07 14:57:23 (UTC+8)
    Publisher: New York: Institute of Electrical and Electronics Engineers (IEEE)
    Abstract: The terminal reliability is an important performance parameter in the design of a highly reliable multistage interconnection network (MIN). In this paper we present a new method which is able to evaluate the terminal reliability of any MIN, with a rather simplified procedure. Implementation considerations and discussions are also provided
    Relation: Circuits and Systems, 1994., Proceedings of the 37th Midwest Symposium on v.1, pp.313-316
    DOI: 10.1109/MWSCAS.1994.519247
    Appears in Collections:[電機工程學系暨研究所] 會議論文

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