淡江大學機構典藏:Item 987654321/38527
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    題名: Modeling reconstruction of coupled transmission lines using time-domain characterization in high-speed digital system
    作者: Liu, Huang-chieh;Hsu, Show-gwo;Lee, Yu-shu;Chiu, Chien-ching
    貢獻者: 淡江大學電機工程學系
    日期: 2003
    上傳時間: 2010-04-15 11:14:21 (UTC+8)
    出版者: New York: Institute of Electrical and Electronics Engineers (IEEE)
    摘要: A novel method is developed to reconstruct the physically structures of a nonuniform couple transmission lines from layer peeling algorithm and genetic algorithm. Base on the time domain reflection (TDR) measurement, the impedance profile of the device under test (D.U.T) is first derived by layer peeling transmission line synthesis. Then, the genetic algorithm (G.A.) is employed to extract the parameter of the lumped/distributed circuits in high-speed digital circuit. As a result, the system characteristic can be easily obtained by the extracted model and SPICE circuit simulation software.
    關聯: Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on (Volume:1 ), pp.304-307
    DOI: 10.1109/ICSMC2.2003.1428251
    顯示於類別:[電機工程學系暨研究所] 會議論文

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